Electron Microscopy

(Laboratory is located in the pavilion of Materials Research, Dúbravská cesta 9)

Electron microscope (JEOL 1200), CCD camera with software EDS Analyzer (Oxford Instruments)

Contact: Ing. Andrej Rusnák, PhD.

Built with the support of the project ITMS 26240120031

ElMi_RusnakJEM 1200 Ex (JOEL) – is a multi-purpose Transmission Electron Microscope, combining the proven optic system of the original JEM-2100 with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

Titan Themis (FEI) – High-throughput sub-Angstrom imaging for atomic 2D and 3D analytics. The FEI Titan™ Themisprovides easy access to atomic information. It combines proven spherical aberration (Cs)-correctors, monochromator system and sensitive ChemiSTEM™ technology, with the new enhanced piezo stage, FEI Velox™ software, and FEI Ceta 16-megapixel CMOS camera—delivering the fastest navigation and instant-zoom to link details from the mesoscopic to the atomic length scales.

EDS analyzer Inca (Oxford Instruments) – Energy Dispersive Spectroscopy (EDS) Analysis provides elemental and chemical analysis of a sample inside the SEM, TEM or FIB. Oxford Instruments provides AZtec, a new and revolutionary materials characterisation system that gathers accurate data at the micro- and nanoscales.